Archive for the ‘Equipment’ Category

FEI Tecnai F-20 Transmission Electron Microscope


FEI 200 kV transmission electron microscope equipped with a CCD camera for STEM, HAADF detector, and EDAX EDX.

TEM Training Guide

FEI Quanta 3D Dual Beam


This instrument has both and electron beam, for normal SEM operations, and ion beam milling and imaging samples. The e-beam column is sourced by a tungsten filament. The ion column is a gallium source. The instrument is also equipped with EDAX EDS system and TSL backscattered electron detector.

The instrument may also be used in an ESEM mode.

Quanta FIB Basic Training – Eucentric, Pt, Trenching

Quanta FIB Basic Training – xT Software

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JEOL 7000 FE Scanning Electron Microscope


The JEOL 7000 FE SEM is equipped with EDX, WDS, EBSD, SE, BE and TE detectors, plus Nabity E-beam lithography.

Operating Instructions:

Basic Operation (PPT)
Exploring the JEOL Program (PPT)
Intro to Oxford EDX (PPT)
Oxford Channel 5 User Manual (PDF)

Related Links:

Oxford Instruments
INCA TIPS (some useful tips when using the Oxford Inca system)
Nabity (Nano-Pattern Generation)
Microscopy Society of America
Royal Microscopy Society

IMAGO Local Electrode Atom Probe (LEAP)

Quantitative 3D Compositional Imaging and Analysis with Atomic Resolution


Instrument Description: (taken in part from Imago Scientific Instruments)
An atom probe specimen is a small pointed tip (microtip) with a ~100nm radius of curvature. A positive voltage is applied to the specimen causing ionization of the surface atoms. Under an applied voltage pulse or laser pulse, the positive ions are “evaporated” from the surface of the sample. Time-of-flight mass spectrometry identifies individual atoms by their elements or isotopes, while point-projection microscopy identifies where atoms were originally located in the specimen. The LEAP uses the principles of both time-of-flight mass spectroscopy and point-projection microscopy to identify individual elements and to locate them within the bulk of a material and build a 3-D image of sample material.

Cryo-System Shutdown and Restart Instructions


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CAMECA Instruments

Bruker D8 Discover with GADDS

The Central Analytical Facility houses a Bruker D8 Discover XRD with GADDS. This unit is equipped with a centric Eulerian cradle and a Vantec 500 area detector. This combination gives the Bruker D8 Discover the capability to handle tasks such as phase identification and quantification, textural and residual stress analysis, single crystal diffraction, determination of particle size, percent crystallinity, and structural identification.


Related Links:

Bruker Training Guide

International Centre for Diffraction Data Homepage