Archive for the ‘Equipment’ Category

Quantum Design Dynacool PPMS

The PPMS DynaCool uses a single two-stage Pulse Tube cooler to cool both the superconducting magnet and the temperature control system, providing a low vibration environment for sample measurements. The instrument employs a unique 4He-based gas flow control system that gives you the rapid temperature cycling and accurate temperature control. It has an integrated Cryopump used to pump out the sample space to a vacuum of < 10-4 Torr.

  • Temperature range of 1.8 K – 400 K
  • 9 Tesla max. field
  • VSM: RMS Sensitivity < 10-6 emu with 1 sec averaging
  • Torque: Moment Sensitivity 1 x 10-7 emu at 9 T

Current location: Bevill 1051

Rigaku X-Ray Diffraction

The Rigaku XRD can be used for measuring thin films, powders and nano particles.

Philips X-Ray Diffraction

The Philips X’Pert MRP can be used for X-ray diffraction (XRD) and X-ray reflection (XRR) measurements. The installed options make it especially suitable for thin films. It is equipped with a Cu anode and a goniometer with cradle, allowing angular movements in 2Theta, Omega, Phi, and Psi, as well as linear positioning in x,y, and z. Line focus and point focus setups are available.

Current location: Bevill 2058.

Kratos Axis Ultra DLD

The Kratos Axis Ultra DLD is an X-ray photoelectron spectroscopy (XPS) system equipped with a dual (Al/Mg) and a monochromated Al X-ray source, and a parallel imaging electron analyzer.

The instrument is capable of large area (700 x 300 μm) and small spot (15 μm) spectroscopy, and it has a spatial resolution (imaging mode) of < 3 μm.

A small spot 5 keV Ar-ion sputter gun allows for depth profiling of samples. A charge neutralizer enables measurement of non-conductive samples (e.g. oxides).

Furthermore, it has a FE electron source for Auger spectroscopy and SEM applications.

The typical base pressure in the analysis chamber is < 8 x 10-10 Torr.

Proto iXRD

The iXRD from Proto is a dedicated XRD intended for measuring residual stress and retained austenite.  Equipped with both Co and Cr X-ray tubes, the iXRD is capable of handling steel and aluminum materials.  The system is stored in an enclosure and operated remotely via laptop using the XRDWin 2.0 software package, used for data collection as well as stress analysis.


Apreo FE-SEM

The Thermo Scientific™ Apreo scanning electron microscope’s (SEM) revolutionary compound lens design combines electrostatic and magnetic immersion technology to yield unprecedented resolution and signal selection. This makes the Apreo SEM the platform of choice for research on nanoparticles, catalysts, powders and nanodevices, without compromising on magnetic sample performance.

The Apreo SEM benefits from the unique in-lens backscatter detection named the Trinity detector system, which provides excellent materials contrast, even at tilt, short working distance, or on sensitive samples. The novel compound lens further improves contrast with energy filtering and adds charge filtering for imaging of insulating samples.

Apreo FE-SEM Basic Training – xT Software and Operation

Basics of Operation

Principles of SEM



The JEOL 8600 EPMA is a tungsten sourced tool equipped with five WDS spectrometers, one Bruker XFlash EDS detector, one Gatan CL detector, in addition to SE and BSE imaging capability.  The instrument uses a combination of Probe for Windows and Bruker Esprit software for an array of analytical needs ranging from quantitative analysis to automated data collection and chemical mapping.


Wet Preparation Facility (TEM)

Please note:

Specimen Wet Preparation has been moved to Bevill 160

Coating, Milling, and Other Non-Wet Preparation (SEM, TEM)


This laboratory contains instrument for preparing TEM and SEM samples for viewing. Instruments include: carbon evaporator, sputter coaters, ion mills.

Instruction downloads:

Cressington 208 Sputter Coater (PPT)
Plasma Cleaner (PPT)